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Aberration Corrected Electron Microscopy (ISSN 153)

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Published in Advances In Imaging And Electron Physics: Aberration Corrected Electron Microscopy (ISSN 153)
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Unlocking the Secrets of the Nanoworld

Advances in Imaging and Electron Physics: Aberration corrected Electron Microscopy (ISSN 153)
Advances in Imaging and Electron Physics: Aberration-corrected Electron Microscopy (ISSN Book 153)
by Charles S. Cockell

4.4 out of 5

Language : English
File size : 31462 KB
Text-to-Speech : Enabled
Enhanced typesetting : Enabled
Print length : 590 pages
Screen Reader : Supported

Aberration corrected electron microscopy (ACEM) is a revolutionary imaging technique that has transformed the field of electron microscopy. By correcting for the inherent aberrations of electron lenses, ACEM allows for the acquisition of images with unprecedented resolution and clarity, opening up new possibilities for imaging and understanding materials at the nanoscale.

This book provides a comprehensive overview of the theory and applications of ACEM, from the basics of electron microscopy to advanced techniques such as atomic-resolution imaging and electron holography. Written by leading experts in the field, the book covers a wide range of topics, including:

  • The principles of electron microscopy
  • The different types of electron microscopes and their applications
  • The theory of aberration correction
  • The practical aspects of aberration correction
  • The applications of ACEM in materials science, nanotechnology, and biology

With its in-depth coverage of the theory and applications of ACEM, this book is an essential resource for researchers, students, and practitioners in the field of electron microscopy.

Key Features

  • Provides a comprehensive overview of the theory and applications of aberration corrected electron microscopy
  • Written by leading experts in the field
  • Covers a wide range of topics, from the basics of electron microscopy to advanced techniques
  • Includes over 500 high-quality images and illustrations
  • An essential resource for researchers, students, and practitioners in the field of electron microscopy

Table of Contents

  1. The Principles of Electron Microscopy
  2. The Different Types of Electron Microscopes and Their Applications
  3. The Theory of Aberration Correction
  4. The Practical Aspects of Aberration Correction
  5. The Applications of ACEM in Materials Science
  6. The Applications of ACEM in Nanotechnology
  7. The Applications of ACEM in Biology
  8. Future Directions in ACEM

Free Download Your Copy Today!

This book is available for Free Download from the following retailers:

  • Our Book Library
  • Barnes & Noble
  • Wiley

Advances in Imaging and Electron Physics: Aberration corrected Electron Microscopy (ISSN 153)
Advances in Imaging and Electron Physics: Aberration-corrected Electron Microscopy (ISSN Book 153)
by Charles S. Cockell

4.4 out of 5

Language : English
File size : 31462 KB
Text-to-Speech : Enabled
Enhanced typesetting : Enabled
Print length : 590 pages
Screen Reader : Supported
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The book was found!
Advances in Imaging and Electron Physics: Aberration corrected Electron Microscopy (ISSN 153)
Advances in Imaging and Electron Physics: Aberration-corrected Electron Microscopy (ISSN Book 153)
by Charles S. Cockell

4.4 out of 5

Language : English
File size : 31462 KB
Text-to-Speech : Enabled
Enhanced typesetting : Enabled
Print length : 590 pages
Screen Reader : Supported
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